Browsing by Author "Tang, B."
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Publication Insights into the effect of TiN thickness scaling on DC and AC NBTI characteristics in replacement metal gate pMOSFETs
; Publication Quantitative and predictive model of reading current variability in deeply scaled vertical poly-Si channel for 3D memories
Proceedings paper2012, International Electron Devices Meeting - IEDM, 10/12/2012, p.902Publication Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs
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