Browsing by Author "Tang, Shun-Wei"
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Publication High Threshold Voltage Enhancement-Mode Regrown p-GaN Gate HEMTs With a Robust Forward Time-Dependent Gate Breakdown Stability
Journal article2022, IEEE ELECTRON DEVICE LETTERS, (43) 10, p.1625-1628Publication Stability of Schottky Barrier Diode Integrated in p-GaN Enhancement-mode GaN Power Technology
Proceedings paper2021, IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), SEP 14-OCT 13, 2021Publication Using Gate Leakage Conduction to Understand Positive Gate Bias Induced Threshold Voltage Shift in p-GaN Gate HEMTs
Journal article2023-02, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 2, p.449-453