Browsing by Author "Taur, Yuan"
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Publication A unified two-band model for oxide traps and interface states in MOS capacitors
Journal article2015, IEEE Transactions on Electron Devices, (62) 3, p.813-820Publication Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures
Journal article2014, Microelectronics Reliability, (54) 4, p.746-754Publication On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps
Meeting abstract2013, 44th IEEE Semiconductor Interface Specialists Conference, 5/12/2013Publication What will end CMOS scaling - money or physics?
Oral presentation2004, IEEE International Electron Devices Meeting - IEDM