Browsing by Author "Thaerigen, Thomas"
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Publication Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
Oral presentation2011, IEEE Semiconductor Wafer Test Workshop - SWTWPublication Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
;Thaerigen, Thomas ;Kanev, Stojan ;Kiesewetter, Joerg ;Hanaway, PeterStrid, EricProceedings paper2011-10, Semicon 13th European Manufacturing Test Conference - EMTC, 12/10/2011