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    On the gate- and drain-voltage dependence of the RTS amplitude in submicron MOSTs

    Simoen, Eddy  
    ;
    Dierickx, Bart
    ;
    De Canne, B.
    ;
    Thoma, F.
    ;
    Claeys, Cor
    Journal article
    1994, Applied Physics A, 58, p.353-358

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