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On the gate- and drain-voltage dependence of the RTS amplitude in submicron MOSTs
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On the gate- and drain-voltage dependence of the RTS amplitude in submicron MOSTs
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Date
1994
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Dierickx, Bart
;
De Canne, B.
;
Thoma, F.
;
Claeys, Cor
Journal
Applied Physics A
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2058
since deposited on 2021-09-29
Acq. date: 2025-12-16
Citations
Metrics
Views
2058
since deposited on 2021-09-29
Acq. date: 2025-12-16
Citations