Browsing by Author "Torres, Andres"
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Publication Complementary dipole exposure solutions at 0.29k1
Proceedings paper2005, Optical Microlithography XVIII, 27/02/2005, p.327-338Publication Defect printability for 100-nm design rule using 193nm lithography
Proceedings paper2002, Photomask and Next-Generation Lithography Mask Technology IX, 23/04/2002, p.640-651Publication Double-patterning decomposition, design compliance, and verification algorithms at 32nm hp
;Tritchkov, Alex ;Glotov, Petr ;Komirenko, Sergey ;Sahouria, Emile ;Torres, AndresSeoud, AhmedProceedings paper2008, Photomask Technology 2008, 6/10/2008, p.71220SPublication Physically-based compact models for fast lithography simulation
;Lafferty, Neal ;Adam, Kostas ;Granik, Yuri ;Torres, AndresMaurer, WilhelmProceedings paper2005, Optical Microlithography XVIII, 1/03/2005, p.537-542Publication Source polarization and OPC effects on illumination optimization
;Brist, Travis ;Bailey, George E. ;Drozdov, Alexander ;Torres, AndresEstroff, AndrewProceedings paper2005, 25th Annual BACUS Symposium on Photomask Technology, 3/10/2005, p.599232Publication Validation of improved compact model in grapho-epitaxy Directed-Self-Assembly (DSA)
Proceedings paper2015, 1st International Symposium on DSA, 26/10/2015