Browsing by Author "Triebl, O."
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Publication Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique
Proceedings paper2009-04, 47th Annual IEEE International Reliability Physics Symposium, 26/04/2009, p.1033-1038Publication Simulation of rReliability of nanoscale devices
Proceedings paper2012, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 5/09/2012