Browsing by Author "Uemura, K."

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Degradation of SiC-MESFETs by irradiation

Ohyama, H.
;
Takakura, K.
;
Uemura, K.
;
Shigaki, K.
;
Kudou, T.
;
Matsumoto, T.
;
Arai, M.
;
Kuboyama, S.
Journal article
2008, Journal of Materials Science: Materials in Electronics, (19) 2, p.175-178
Effect of gate interface on performance degration of irradiated SiC-MESFET

Ohyama, H.
;
Takakura, K.
;
Yoneoka, M.
;
Uemura, K.
;
Motoki, M.
;
Matsuo, K.
;
Arai, M.
;
Kuboyama, S.
Journal article
2007, Physica B, 401-402, p.37-40