Browsing by Author "Van Aert, Sandra"

Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images

Chapter Four - Atom counting

Chapter One - Introduction

Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability

Chapter Six - Atom column detection

Chapter Three - Efficient fitting algorithm

Chapter Two - Statistical parameter estimation theory: principles and simulation studies

Single atom detection from low contrast-to-noise ratio electron microscopy images

The maximum a posteriori probability rule for atom column detection from HAADF STEM images

The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images