Browsing by Author "Van Berkum, J."
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Publication Atomistic modeling of impurity ion implantation in ultra-thin-body Si devices
Proceedings paper2008, IEEE International Electron Devices Meeting - IEDM, 15/12/2008, p.535-538Publication Tuning PMOS Mo(O,N) metal gates to NMOS by addition of DyO capping layer
Proceedings paper2007, Technical Digest International Electron Devices Meeting - IEDM, 10/12/2007, p.329-332