Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Van Dooren, Sofie"

Filter results by typing the first few letters
Now showing 1 - 8 of 8
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Integration of anodized tantalum capacitors in thin film MCM-D

    Van Dooren, Sofie
    ;
    Beyne, Eric  
    Oral presentation
    1999, 4th IMAPS Advance Technology Workshop on Integrated Passives Technology
  • Loading...
    Thumbnail Image
    Publication

    Parametric compact models for flip chip assemblies

    Van Dooren, Sofie
    ;
    Vandevelde, Bart  
    ;
    Beyne, Eric  
    ;
    Christiaens, Filip
    ;
    Corlatan, D.
    Journal article
    2000, IEEE Trans. Components and Packaging Technologies, (23) 3, p.555-561
  • Loading...
    Thumbnail Image
    Publication

    Parametric compact models for flip chip assemblies

    Van Dooren, Sofie
    ;
    Vandevelde, Bart  
    ;
    Beyne, Eric  
    ;
    Christiaens, Filip
    ;
    Corlatan, D.
    Proceedings paper
    1999, 5th International Workshop Thermal Investigations of ICs and Systems - THERMINIC, 3/10/1999, p.312-318
  • Loading...
    Thumbnail Image
    Publication

    Parametric compact models for the 72-pins polymer stud grid array (Tm)

    Driessens, Evelien
    ;
    Van Dooren, Sofie
    ;
    Vandevelde, Bart  
    ;
    Degryse, Dominiek
    ;
    Beyne, Eric  
    Journal article
    2001, Microelectronics Journal, (32) 10_11, p.839-846
  • Loading...
    Thumbnail Image
    Publication

    Parametric compact models for the 72-pins Polymer Stud Grid ArrayTM

    Driessens, Evelien
    ;
    Van Dooren, Sofie
    ;
    Vandevelde, Bart  
    ;
    Degryse, Dominiek
    ;
    Beyne, Eric  
    Proceedings paper
    2000, Proceedings of the 6th International Workshop on Thermal Investigations of ICs and Systems - THERMINIC, 24/09/2000, p.205-210
  • Loading...
    Thumbnail Image
    Publication

    The isocurrent test: a promising tool for wafer-level evaluation of the interconnect reliability

    Witvrouw, Ann
    ;
    Van Dooren, Sofie
    ;
    Wouters, Dirk
    ;
    Van Dievel, Marc  
    ;
    Maex, Karen  
    Journal article
    1996, Microelectronics and Reliability, 36, p.1847-1850
  • Loading...
    Thumbnail Image
    Publication

    Transient thermal characterization of the polymer stud grid array(tm)

    Driessens, Evelien
    ;
    Van Dooren, Sofie
    ;
    Vandevelde, Bart  
    ;
    Degryse, Dominiek
    ;
    Beyne, Eric  
    Journal article
    2001, IEEE Trans. Components and Packaging Technologies, (24) 4, p.554-558
  • Loading...
    Thumbnail Image
    Publication

    Transient thermal characterization of the Polymer Stud Grid ArrayTM

    Driessens, Evelien
    ;
    Van Dooren, Sofie
    ;
    Vandevelde, Bart  
    ;
    Beyne, Eric  
    ;
    Heerman, M.
    Proceedings paper
    2000, Proceedings of the 6th International Workshop on Thermal Investigations of ICs and Systems - THERMINIC, 24/09/2000, p.225-229

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings