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Browsing by Author "Van Hoorebeke, Luc"

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    3D stacking of ultra-thin chip packages: an innovative packaging and interconnection technology

    Priyabadini, Swarnakamal
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    Sterken, Tom  
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    Van Hoorebeke, Luc
    ;
    Vanfleteren, Jan  
    Journal article
    2013-07, IEEE Transactions on Components and Packaging Technologies, 3, p.1144-1122
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    Combined 3D chemical and morphological characterization using an integrated system

    Boone, Matthieu N.
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    Laforce, Brecht
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    Masschaele, Bert
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    Schaubroeck, David  
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    Dierick, Manuel
    Proceedings paper
    2017, 3rd International Conference on Tomography of Materials and Structures - ICTMS, 26/06/2017
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    Data-driven affine deformation estimation and correction in cone beam computed tomography

    Van Nieuwenhove, Vincent
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    De Beenhouwer, Jan  
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    De Schryver, Thomas
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    Van Hoorebeke, Luc
    Journal article
    2017-01, IEEE Transactions on Image Processing, (2017) 26, p.1441-1451
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    High yield fabrication process for 3D-stacked ultra-thin chip packages using photo-definable polyimide and symmetry in packages

    Priyabadini, Swarnakamal
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    Sterken, Tom  
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    Cauwe, Maarten  
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    Van Hoorebeke, Luc
    ;
    Vanfleteren, Jan  
    Journal article
    2014, IEEE Transactions on Components, Packaging and Manufacturing Technology, (4) 1, p.158-167
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    Integrated three-dimensional microanalysis combining X-ray microtomography and X-ray fluorescence methodologies

    Laforce, Brecht
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    Masschaele, Bert
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    Boone, Matthieu
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    Schaubroeck, David  
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    Dierick, Manuel
    Journal article
    2017, Analytical Chemistry, 89, p.10617-10624
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    Method for auto-alignment and determination of parameter space in dual-phase grating interferometry

    Tang, Ruizhi
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    Goethals, Wannes
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    Organista, Caori
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    Van Hoorebeke, Luc
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    Stampanoni, Marco
    Journal article
    2024, OPTICS EXPRESS, (32) 8, p.14607-14619
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    Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection

    Janssens, Eline
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    De Beenhouwer, Jan  
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    Van Dael, Mattias
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    De Schryver, Thomas
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    Van Hoorebeke, Luc
    Journal article
    2018, Measurement Science and Technology, (29) 3, p.34012
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    Self-Absorption Correction in X-Ray Fluorescence-Computed Tomography With Deep Convolutional Neural Network

    Gao, Bo
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    Aelterman, Jan  
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    Laforce, Brecht
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    Van Hoorebeke, Luc
    ;
    Vincze, Laszlo
    ;
    Boone, Matthieu
    Journal article
    2021, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (68) 6, p.1194-1206

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