Browsing by Author "Van Moer, W."
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Publication A first step towards a wave-based 'stochastic' calibration for multi-port vectorial network analyzers
Publication An automatic harmonic selection scheme based on spectrum analyzer measurements
Meeting abstract2003, 22nd Benelux Meeting on Systems and Control, 19/03/2003Publication An automatic harmonic selection scheme based on spectrum analyzer measurements
Proceedings paper2002, 60th ARFTG conference digest, 5/12/2002, p.123-130Publication An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer
Publication An improved algorithm to create spectrally pure signals
Meeting abstract2005, Book of Abstracts 24th Benelux Meeting on Systems and Control, 22/03/2005, p.31Publication Bit-error-rate estimation for OFDM based telecommunication systems schemes in the presence of nonlinear distortions
Proceedings paper2000, 55th Spring ARFTG Conference Digest - "Going beyond S-Parameters", 15/06/2000, p.89Publication Block-oriented instrument software design
Publication Building a differential signal source
Proceedings paper2003, 62nd ARFTG Conference Digest, 2/12/2003Publication Characterisation of multiport systems through 3-port LSNA measurements
Van Moer, W.Oral presentation2003, NISTPublication Characterisation of multiport systems through 3-port LSNA measurements
Publication Creating spectrally pure signals for ADC-testing
Meeting abstract2004, 23rd Benelux Meeting on Systems and Control, 17/03/2004Publication Creating spectrally pure signals for ADC-testing
Proceedings paper2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference - IMTC, 20/03/2003, p.614-618Publication Determining the reciprocity of mixers through 3-port LSNA measurements
Publication Estimation and validation of semi-parametric dynamic nonlinear models
Publication Measuring in-band distortions of mixers
Publication Measuring mixed signal substrate coupling
Proceedings paper2000, Proceedings of the 17th IEEE Instrumentation ad Measurement Technology Conference, 1/05/2000, p.855-859Publication Measuring mixed-signal substrate coupling
Journal article2001, IEEE Trans. Instrumentation and Measurement, (50) 4, p.959-964Publication Measuring nonlinear differential RF amplifiers using one single-ended source
Publication Measuring nonlinear differential RF amplifiers using one single-ended source
Publication Measuring the sensitivity of microwave components to bias vibrations