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Measuring mixed-signal substrate coupling
Publication:
Measuring mixed-signal substrate coupling
Date
2001
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rolain, Y.
;
Van Moer, W.
;
Vandersteen, Gerd
;
Van Heijningen, Marc
Journal
IEEE Trans. Instrumentation and Measurement
Abstract
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1924
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Acq. date: 2025-10-25
Citations
Metrics
Views
1924
since deposited on 2021-10-14
422
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations