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Browsing by Author "Vanalme, G."

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    A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers

    Van Meirhaeghe, R.
    ;
    Vanalme, G.
    ;
    Goubert, L.
    ;
    Cardon, F.
    ;
    Van Daele, P.
    Oral presentation
    1998, MRS Spring Meeting 1998. Symposium S: Nanoscale Characterization Using Scanning Probes; April 13-16, 1998; San Francisco, CA, US

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