Browsing by Author "Vanalme, G."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers
;Van Meirhaeghe, R. ;Vanalme, G. ;Goubert, L. ;Cardon, F.Van Daele, P.Oral presentation1998, MRS Spring Meeting 1998. Symposium S: Nanoscale Characterization Using Scanning Probes; April 13-16, 1998; San Francisco, CA, US