Publication:
A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers
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2009 since deposited on 2021-10-01
Acq. date: 2026-06-13
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Statistics
Views
2009 since deposited on 2021-10-01
Acq. date: 2026-06-13
Citations