Publication:

A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers

Date

1998
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Author(s)

Van Meirhaeghe, R.
;
Vanalme, G.
;
Goubert, L.
;
Cardon, F.
;
Van Daele, P.

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Abstract

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1992 since deposited on 2021-10-01
Acq. date: 2025-10-22

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1992 since deposited on 2021-10-01
Acq. date: 2025-10-22

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