Publication:
A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers
Date
| dc.contributor.author | Van Meirhaeghe, R. | |
| dc.contributor.author | Vanalme, G. | |
| dc.contributor.author | Goubert, L. | |
| dc.contributor.author | Cardon, F. | |
| dc.contributor.author | Van Daele, P. | |
| dc.date.accessioned | 2021-10-01T09:22:04Z | |
| dc.date.available | 2021-10-01T09:22:04Z | |
| dc.date.issued | 1998 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3062 | |
| dc.source.conference | MRS Spring Meeting 1998. Symposium S: Nanoscale Characterization Using Scanning Probes; April 13-16, 1998; San Francisco, CA, US | |
| dc.source.conferencelocation | ||
| dc.title | A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |