Browsing by Author "Vandamme, Lorenz"
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Publication Characterization of integrated resistors for broadband telecom printed circuit boards
Proceedings paper1996, Proceedings of the Technical Conference IPC Printed Circuits Expo 1996; 3-7 March 1996; San Jose, CA, USA., p.S6-1-1->S6-1-10Publication Critical discussion on unified 1/f noise models for MOSFETs
Publication Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality
Publication Diagnostics of the quality of MOSFETs
Publication Impact of silicon substrate, iron contamination and perimeter on saturation current and noise in n+p diodes
Publication Low frequency noise analysis as a diagnostic tool to assess the quality of 0.25 μm Ti-silicided poly-lines
Proceedings paper1998, Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF, 5/10/1998, p.925-929Publication Low frequency noise analysis as a diagnostic tool to assess the quality of 0.25 μm Ti-silicided poly-lines..
Journal article1998, Microelectronics Reliability, (38) 6_8, p.925-929Publication Mixed assembly of PCB using a novel flip-chip technology
Journal article2000, Advancing Microelectronics, (27) 5, p.28-30Publication Modeling 1/f noise and extraction of the SPICE noise parameters using a new extraction procedure
Proceedings paper1998, Proceedings of the 28th European Solid-State Device Research Conference - ESSDERC'98; 8-10 Sept. 1998; Bordeaux, France., p.468-471Publication The use of integrated resistors and buried capacitance in high performance telecom printed circuit boards
Proceedings paper1996, EuPac '96.2nd European Conference on Electronic Packaging Technology and 8th International Conference on Interconnection Technol, p.11-14Publication Unsolved problemns on 1/f noise in MOSFETs and possible solutions
Publication Unsolved problemns on 1/f noise in MOSFETs and possible solutions