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Conference contributions
Low frequency noise analysis as a diagnostic tool to assess the quality of 0.25 μm Ti-silicided poly-lines
Publication:
Low frequency noise analysis as a diagnostic tool to assess the quality of 0.25 μm Ti-silicided poly-lines
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Date
1998
Proceedings Paper
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2628.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandamme, Ewout
;
De Wolf, Ingrid
;
Lauwers, Anne
;
Vandamme, Lorenz
Journal
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2
since deposited on 2021-10-01
Acq. date: 2025-12-15
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1985
since deposited on 2021-10-01
Acq. date: 2025-12-15
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Downloads
2
since deposited on 2021-10-01
Acq. date: 2025-12-15
Views
1985
since deposited on 2021-10-01
Acq. date: 2025-12-15
Citations