Browsing by Author "Vandelli, Luca"
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Publication A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
Journal article2011, IEEE Transactions on Electron Devices, (58) 9, p.3147-3155Publication Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability
Journal article2012, Applied Physics Letters, (101) 5, p.53505Publication Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories
Journal article2010, IEEE Electron Device Letters, (31) 9, p.936-938Publication Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability
Proceedings paper2010, 48th Annual IEEE International Reliability Physics Symposium - IRPS, 2/05/2010, p.731-737Publication SrTiO3 for sub-20 nm DRAM technology nodes – characterization and modeling
Proceedings paper2014, IEEE Semiconductor Interfaces Specialist Conference - SISC, 10/12/2014Publication SrTiOx for sub-20 nm DRAM technology nodes - characterization and modeling
Journal article2015, Microelectronic Engineering, 147, p.126-129