Publication:

Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories

Date

2010
Journal article
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Author(s)

Suhane, Amit
;
Arreghini, Antonio  
;
Van den Bosch, Geert  
;
Vandelli, Luca
;
Padovani, Andrea
;
Breuil, Laurent  
;
Larcher, Luca
;
De Meyer, Kristin  
;
Van Houdt, Jan  

Journal

IEEE Electron Device Letters

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1936 since deposited on 2021-10-18
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1936 since deposited on 2021-10-18
Acq. date: 2026-01-26

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