Publication:

Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories

Date

2010
Journal article
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dc.contributor.authorSuhane, Amit
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVandelli, Luca
dc.contributor.authorPadovani, Andrea
dc.contributor.authorBreuil, Laurent
dc.contributor.authorLarcher, Luca
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-18T22:05:20Z
dc.date.available2021-10-18T22:05:20Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18053
dc.source.beginpage936
dc.source.endpage938
dc.source.issue9
dc.source.journalIEEE Electron Device Letters
dc.source.volume31
dc.title

Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories

dc.typeJournal article
dspace.entity.typePublication
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