Publication:
Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories
Date
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-7493-9681 | |
| cris.virtual.orcid | 0000-0001-9971-6954 | |
| cris.virtual.orcid | 0000-0003-2869-1651 | |
| cris.virtual.orcid | 0000-0003-1381-6925 | |
| cris.virtualsource.department | d910b17c-774d-4036-8b49-51680f68b5e2 | |
| cris.virtualsource.department | ce03ac04-c546-4df1-a775-1c68e533233e | |
| cris.virtualsource.department | 5a95d7fb-60a3-41d3-9237-399e069d07d9 | |
| cris.virtualsource.department | 39ca1b0f-7306-4c78-a654-f9ff9f4c8183 | |
| cris.virtualsource.orcid | d910b17c-774d-4036-8b49-51680f68b5e2 | |
| cris.virtualsource.orcid | ce03ac04-c546-4df1-a775-1c68e533233e | |
| cris.virtualsource.orcid | 5a95d7fb-60a3-41d3-9237-399e069d07d9 | |
| cris.virtualsource.orcid | 39ca1b0f-7306-4c78-a654-f9ff9f4c8183 | |
| dc.contributor.author | Suhane, Amit | |
| dc.contributor.author | Arreghini, Antonio | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Vandelli, Luca | |
| dc.contributor.author | Padovani, Andrea | |
| dc.contributor.author | Breuil, Laurent | |
| dc.contributor.author | Larcher, Luca | |
| dc.contributor.author | De Meyer, Kristin | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.imecauthor | Arreghini, Antonio | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Breuil, Laurent | |
| dc.contributor.imecauthor | De Meyer, Kristin | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.orcidimec | Arreghini, Antonio::0000-0002-7493-9681 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Breuil, Laurent::0000-0003-2869-1651 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2021-10-18T22:05:20Z | |
| dc.date.available | 2021-10-18T22:05:20Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2010 | |
| dc.identifier.issn | 0741-3106 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18053 | |
| dc.source.beginpage | 936 | |
| dc.source.endpage | 938 | |
| dc.source.issue | 9 | |
| dc.source.journal | IEEE Electron Device Letters | |
| dc.source.volume | 31 | |
| dc.title | Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |