Browsing by Author "Vandewalle, N."
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Publication Analysis of the gate voltage fluctuations in ultra-thin gate oxides after soft breakdown
Proceedings paper1998, Technical Digest International Electron Devices Meeting - IEDM, 6/12/1998, p.909-912Publication Non-Gaussian behavior and anticorrelations in ultrathin gate oxides after soft breakdown
Journal article1999, Appl. Phys. Lett., (74) 11, p.1579-1581Publication Technology and reliability aspects of ultra-thin silicon dioxide layers
Oral presentation1999, International Symposium on Surface Science for Micro- and Nano-Device Fabrication - ISSS-3Publication Technology and reliability of sub-3nm oxides
Proceedings paper1999, 4th Symposium on Thin Gate Oxides, 22/01/1999, p.1-7