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Browsing by Author "Vanhorebeek, Guido"

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    A 1Mbit HIMOS® flash memory embedded in a 0.35μm CMOS process

    Van Houdt, Jan  
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    Tsouhlarakis, Jorgo  
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    Hendrickx, Paul  
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    Vanhorebeek, Guido
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    Wellekens, Dirk  
    Oral presentation
    2000, 17th IEEE Nonvolatile Semiconductor Memory Workshop; 13-17 February 2000; Monterey, Ca, USA.
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    A 25ns/byte-programmable low-power SSI flash array with a new low-voltage erase scheme for embedded memory applications

    Van Houdt, Jan  
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    Haspeslagh, Luc  
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    Wellekens, Dirk  
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    Vanhorebeek, Guido
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    Groeseneken, Guido  
    Proceedings paper
    1995, 14th IEEE Nonvolatile Semiconductor Memory Workshop, 13/08/1995, p.2.2
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    A flash memory technology with quasi-virtual ground array for low-cost embedded applications

    Tsouhlarakis, Jorgo  
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    Vanhorebeek, Guido
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    Verhoeven, Geert
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    De Blauwe, Jan
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    Kim, Shi-Ho
    Journal article
    2001, IEEE Journal of Solid-State Circuits, (36) 6, p.969-978
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    Correlation between predicted cause of SRAM failures and in-line defect data

    Coppens, P.
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    Vanhorebeek, Guido
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    De Backer, E.
    Journal article
    2001, Microelectronics Reliability, (41) 1, p.53-57
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    High performance modules for integrated passives in silicon technologies

    Jenei, Snezana
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    Decoutere, Stefaan  
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    Van Huylenbroeck, Stefaan  
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    Vanhorebeek, Guido
    Journal article
    2001, Microwave Engineering Europe, p.41,44,47-8,50,53
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    High Q inductors and capacitors on Si substrate

    Jenei, Snezana
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    Decoutere, Stefaan  
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    Van Huylenbroeck, Stefaan  
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    Vanhorebeek, Guido
    Proceedings paper
    2001, Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, 2001. Digest of Papers;, 12/09/2001, p.64-70
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    Innovating SRAM design and test program for fast process related defect recognition and failure analysis

    Coppens, P.
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    Vanhorebeek, Guido
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    De Backer, E.
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    Yuan, Xiao Jie
    Proceedings paper
    1999, In-Line Methods and Monitors for Process and Yield Improvement, 22/09/1999, p.290-297
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    Innovating SRAM design for fast process related defect recognition and failure analysis

    Coppens, P.
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    Vanhorebeek, Guido
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    De Backer, E.
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    Yuan, Xiao Jie
    Proceedings paper
    1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference, 13/09/1999, p.220-223
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    Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays

    Van Houdt, Jan  
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    Wellekens, Dirk  
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    Vanhorebeek, Guido
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    Haspeslagh, Luc  
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    Deferm, Ludo  
    Proceedings paper
    1995, 25th European Solid State Device Research Conference - ESSDERC, 25/09/1995, p.553-556
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    Multi-level charge storage in source-side injection Flash EEPROM

    Montanari, Donato
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    Van Houdt, Jan  
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    Wellekens, Dirk  
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    Vanhorebeek, Guido
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    Haspeslagh, Luc  
    Proceedings paper
    1996, 6th Biennial IEEE International Nonvolatile Memory Technology Conference, 24/06/1996, p.80-83
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    Voltage variant source side injection for multilevel storage in flash EEPROM

    Montanari, Donato
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    Van Houdt, Jan  
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    Wellekens, Dirk  
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    Vanhorebeek, Guido
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    Haspeslagh, Luc  
    Journal article
    1997, IEEE Trans. on Components, Packaging, and Manufacturing Technology. Part A, (20) 2, p.196-202

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