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Correlation between predicted cause of SRAM failures and in-line defect data
Publication:
Correlation between predicted cause of SRAM failures and in-line defect data
Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Coppens, P.
;
Vanhorebeek, Guido
;
De Backer, E.
Journal
Microelectronics Reliability
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1961
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1961
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations