Correlation between predicted cause of SRAM failures and in-line defect data

Publication:

2001

Journal article

Author(s)

Coppens, P.

;

Vanhorebeek, Guido

;

De Backer, E.

Microelectronics Reliability

1964 since deposited on 2021-10-14

1last month

Acq. date: 2025-12-10