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Browsing by Author "Vanhoyland, Geert"

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    Characterization and structural study of lanthanum citrate trihydrate (La(C6H5O7)(H2O)(2))center dot H2O

    Vanhoyland, Geert
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    Pagnaer, J.
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    D'Haen, Jan  
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    Mullens, S.
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    Mullens, J.
    Journal article
    2005, Journal of Solid State Chemistry, (178) 1, p.166-171
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    Effect of pyrolysis temperature on the properties of Bi3.5La0.5Ti3012 thin films deposited by aqueous chemical solution deposition

    Hardy, An  
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    Nelis, Daniel
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    Vanhoyland, Geert
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    Van Bael, Marlies  
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    Van den Rul, Heidi
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    Mullens, J.
    Journal article
    2005, Materials Chemistry and Physics, (92) 2_3, p.431-437
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    Enhanced polarization of vanadium co-substituted BLT ((Bi, La)4Ti3012)thin films prepared by aqueous chemical solution deposition

    Hardy, An  
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    Vanhoyland, Geert
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    Van den Rul, Heidi
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    Van Bael, Marlies  
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    Mullens, J.
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    Van Poucke, L.C.
    Oral presentation
    2005, 17th Intern. Symp. on Integrated Ferroelectrics
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    Exploration of aqueous chemical solution deposition rouotes to ferroelectric thin films

    Van Bael, Marlies  
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    Nelis, Daniel
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    Van Werde, Kristof
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    Mondelaers, Dirk
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    Hardy, An  
    Meeting abstract
    2001, 13th International Symposium on Integrated Ferroelectrics - ISIF, 11/03/2001, p.224
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    Gel structure, gel decomposition and phase formation mechanisms in the aqueous solution-gel route to lanthanum substituted bismuth titanate

    Hardy, An  
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    Vanhoyland, Geert
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    Geuzens, E.
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    Van Bael, M.K.
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    Mullens, J.
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    Van Poucke, L.C.
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    D'Haen, Jan  
    Journal article
    2005, Journal of Sol-Gel Science and Technology, (33) 3, p.283-298
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    Preparation of La0.5Sr0.5C0O3 powders and thin film from a new aqueous solution-gel precursor

    Pagnaer, John
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    Hardy, An  
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    Mondelaers, A.
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    Vanhoyland, Geert
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    D'Haen, Jan  
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    Van Bael, Marlies  
    Journal article
    2005, Materials Science and Engineering B, (118) 1_3, p.79-83
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    Pulsed DC sputtered aluminum nitride: a novel approach to control stress and C-axis orientation

    Soussan, Philippe  
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    O'Donnell, Kathy
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    D'Haen, Jan  
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    Vanhoyland, Geert
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    Beyne, Eric  
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    Tilmans, Harrie  
    Proceedings paper
    2005, Materials, Integration and Packaging Issues for High-Frequency Devices II, 29/11/2004, p.49-54
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    Study of stress evolution during full silicidation for gate stacks

    Torregiani, Cristina
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    Kittl, Jorge
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    Capponi, Simona
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    Vanhoyland, Geert
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    Brongersma, Sywert  
    Proceedings paper
    2005-05, Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS: New Materials, Processes, and Equipment, 15/05/2005, p.249-256

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