Browsing by Author "Vasilev, Alexander"
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors
Proceedings paper2020, IEEE International Integrated Reliability Workshop (IIRW), OCT 04-NOV 01, 2020, p.31-34Publication TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs
Journal article2022-04-19, IEEE TRANSACTIONS ON ELECTRON DEVICES, (69) 6, p.3290-3295