Browsing by Author "Vegh, Gerzson"
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Publication Analysis of irradiation induced defects in silicon devices
Proceedings paper1995, RELECTRONIC '95. 9th Symposium on Quality and Reliability in Electronics; 16-18 Oct. 1995; Budapest, Hungary., p.329-34Publication Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon
Meeting abstract1994, 186th Electrochemical Society Fall Meeting: Symposium on High Purity Silicon III, 9/10/1994, p.625