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Browsing by Author "Velayudhan, V."

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    Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale

    Bayerl, A.
    ;
    Porti, Marc
    ;
    Martin-Martinez, Javier
    ;
    Lanza, M.
    ;
    Rodriguez, Rosanna
    ;
    Velayudhan, V.
    Proceedings paper
    2013, IEEE International Reliability Physics Symposium - IRPS, 14/04/2013, p.5D4.1-5D4.6

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