Browsing by Author "Velayudhan, V."
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Publication Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale
;Bayerl, A. ;Porti, Marc ;Martin-Martinez, Javier ;Lanza, M. ;Rodriguez, RosannaVelayudhan, V.Proceedings paper2013, IEEE International Reliability Physics Symposium - IRPS, 14/04/2013, p.5D4.1-5D4.6