Publication:
Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale
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1938 since deposited on 2021-10-21
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Acq. date: 2025-12-09
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Views
1938 since deposited on 2021-10-21
1last month
1last week
Acq. date: 2025-12-09
Citations