Publication:

Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale

Date

2013
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorBayerl, A.
dc.contributor.authorPorti, Marc
dc.contributor.authorMartin-Martinez, Javier
dc.contributor.authorLanza, M.
dc.contributor.authorRodriguez, Rosanna
dc.contributor.authorVelayudhan, V.
dc.contributor.authorAmat, Esteve
dc.contributor.authorNafria, Montse
dc.contributor.authorAymerich, X.
dc.contributor.authorGonzalez, Mireia B
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-21T06:45:02Z
dc.date.available2021-10-21T06:45:02Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22025
dc.source.beginpage5D4.1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate14/04/2013
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage5D4.6
dc.title

Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions