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Browsing by Author "Velayudhan, Vikas"

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    Publication

    A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs

    Wu, Qian
    ;
    Bayerl, A.
    ;
    Porti, Marc
    ;
    Martin-Martinez, Javier
    ;
    Lanza, Mario
    ;
    Rodiguez, Rosanna
    Journal article
    2014, IEEE Transactions on Electron Devices, (61) 9, p.3118-3124

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