A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs

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Author(s)

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Martin-Martinez, Javier

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Rodiguez, Rosanna

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Velayudhan, Vikas

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Nafria, Montserrat

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Aymerich, Xavier

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Gonzalez, Mireia B

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Journal

IEEE Transactions on Electron Devices

Metrics

1977 since deposited on 2021-10-22

Acq. date: 2025-10-24