Publication:

A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs

Date

2014
Journal article
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Author(s)

Wu, Qian
;
Bayerl, A.
;
Porti, Marc
;
Martin-Martinez, Javier
;
Lanza, Mario
;
Rodiguez, Rosanna
;
Velayudhan, Vikas
;
Nafria, Montserrat
;
Aymerich, Xavier
;
Gonzalez, Mireia B
;
Simoen, Eddy  

Journal

IEEE Transactions on Electron Devices

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1986 since deposited on 2021-10-22
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