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Browsing by Author "Velghe, R.D.M.A."

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    Modeling and characterization of noise in 90nm CMOS technology

    Scholten, Andries
    ;
    Tiemeijer, Luuk
    ;
    Zegers-van Duijnhoven, A.T.A.
    ;
    Havens, R.J.
    ;
    de Kort, R.
    Proceedings paper
    2005, Noise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF, 19/09/2005, p.735-740

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