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Browsing by Author "Verbiest, Thierry"

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    Asymmetric optical second-harmonic generation from chiral G-shaped gold nanostructures

    Valev, Ventsislav
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    Silhanek, Alejandro
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    Verellen, Niels  
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    Gillijns, Werner  
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    Van Dorpe, Pol  
    Journal article
    2010, Physical Review Letters, (104) 12, p.127401
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    Difference in the nonlinear optical response of epitaxial Si on Ge(001) grown from SiH4 at 500 °C and from Si3H8 at 350 °C

    Valev, Ventsislav
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    Leys, Frederik
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    Caymax, Matty  
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    Verbiest, Thierry
    Oral presentation
    2008, E-MRS Spring Meeting Symposium J: Beyond Silicon Technology: Materials and Devices for Post-Si CMOS
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    Plasmon enhanced fluorescence from meticulously positioned gold nanoparticles, deposited by ultra sonic spray coating on organic light emitting diodes

    Kumar, Rachith Shanivarasanthe Nithyananda
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    Eerdekens, Maarten
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    de Coene, Yovan
    Journal article
    2023, NANOSCALE ADVANCES, (5) 6, p.1750-1759
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    Second-harmonic generation as characterization tool for Ge/passivation layer interfaces

    Vanbel, Maarten
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    Delabie, Annelies  
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    Sioncke, Sonja
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    Adelmann, Christoph  
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    Afanasiev, Valeri  
    Proceedings paper
    2012, Nonlinear Optics and Applications VI, 16/04/2012, p.84341F
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    SHG/2PF microscopy of single and multi-layer graphene

    Klekachev, Alexander
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    Asselberghs, Inge  
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    Huyghebaert, Cedric  
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    Vanbel, Maarten
    Proceedings paper
    2012, Optical Processes in Organic Materials and Nanostructures, 12/08/2012, p.847405
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    Si passivation for Ge pMOSFETs: impact of Si cap growth conditions

    Vincent, Benjamin  
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    Loo, Roger  
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    Vandervorst, Wilfried  
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    Delmotte, Joris
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    Douhard, Bastien  
    Journal article
    2011, Solid-State Electronics, (60) 1, p.116-121
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    Ultimate Ge passivation: process and materials characterization of ultrathin Si cap layers grown on Ge substrates

    Vincent, Benjamin  
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    Caymax, Matty  
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    Vandervorst, Wilfried  
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    Valev, Ventislav
    ;
    Verbiest, Thierry
    Meeting abstract
    2010, MRS Spring Meeting Symposium I: Materials for End-of Roadmap Scaling of CMOS Devices, 5/04/2010, p.I4.3

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