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Browsing by Author "Verheyen,"

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    Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain

    Amat, Esteve
    ;
    Rodriguez, Rosana
    ;
    Bargallo Gonzalez, Mireia
    ;
    Martin Martinez, Javier
    Proceedings paper
    2010, IEEE International Conference on Solid-State and Integrated Circuit Technology - ICSICT, 1/11/2010

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