Browsing by Author "Verheyen,"
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Publication Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
;Amat, Esteve ;Rodriguez, Rosana ;Bargallo Gonzalez, MireiaMartin Martinez, JavierProceedings paper2010, IEEE International Conference on Solid-State and Integrated Circuit Technology - ICSICT, 1/11/2010