Browsing by Author "Verstraeten, K."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence
; ; ;Van Doorne, Patrick; ; Verstraeten, K.Journal article2001, Spectrochimica Acta B, 56, p.2321-2330