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Browsing by Author "Verstraeten, K."

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    Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence

    Vereecke, Guy  
    ;
    Arnauts, Sophia  
    ;
    Van Doorne, Patrick
    ;
    Kenis, Karine  
    ;
    Onsia, Bart  
    ;
    Verstraeten, K.
    Journal article
    2001, Spectrochimica Acta B, 56, p.2321-2330

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