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Browsing by Author "Vexler, M."

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    Publication

    Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology

    Makarov, A
    ;
    Tyaginov, Stanislaw
    ;
    Kaczer, Ben  
    ;
    Jech, M.
    ;
    Vaisman Chasin, Adrian  
    ;
    Grill, A.
    Proceedings paper
    2017, IEEE International Electron Devices Meeting - IEDM, 2/12/2017, p.310-313

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