Browsing by Author "Vexler, M. I."
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Publication Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Proceedings paper2017, IEEE International Electron Devices Meeting - IEDM, 2/12/2017, p.310-313Publication On the Contribution of Secondary Holes in Hot-Carrier Degradation a Compact Physics Modeling Perspective
; ; ; ; Proceedings paper2023, 7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM), MAR 07-10, 2023