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Browsing by Author "Vexler, M.I."

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    A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs

    Sharma, P.
    ;
    Tyaginov, S.
    ;
    Rauch, S.E.
    ;
    Franco, Jacopo  
    ;
    Kaczer, Ben  
    ;
    Makarov, A.
    ;
    Vexler, M.I.
    Proceedings paper
    2016, 46th European Solid-State Device Research Conference - ESSDERC, 12/09/2016, p.428-431

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