Browsing by Author "Vickridge, Ian"
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Publication Compositional analysis on ensemble of InGaAs fins using TEM and Rutherford backscattering spectrometry
Meeting abstract2017, European Materials Research Society Fall Meeting, 18/09/2017Publication Elastic backscattering during boron implantation in Si1-xGex
Journal article2024, VACUUM, (219) Part A, January, p.Art. 112740Publication Rutherford backscattering spectrometry analysis of InGaAs nanostructures
Journal article2019, Journal of Vacuum Science and Technology A, (37) 2, p.020601-1-020601-5