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Browsing by Author "Vilkelis, G."

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    Monitoring of neutron transmutation doped silicon recombination properties by microwave absorption transient techniques

    Gaubas, Eugenijus
    ;
    Vanhellemont, Jan
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Clauws, P.
    ;
    Kraner, H. W.
    Proceedings paper
    1996, Proceedings of the 4th International Symposium on High Purity Silicon, 6/10/1996, p.439-449
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    Study of recombination properties of neutron transmutation doped wafers

    Gaubas, Eugenijus
    ;
    Vanhellemont, Jan
    ;
    Simoen, Eddy  
    ;
    Clauws, P.
    ;
    Kraner, H. W.
    ;
    Vilkelis, G.
    Journal article
    1997, Semiconductor Science and Technology, (12) 9, p.1092-1099

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