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Monitoring of neutron transmutation doped silicon recombination properties by microwave absorption transient techniques
Publication:
Monitoring of neutron transmutation doped silicon recombination properties by microwave absorption transient techniques
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Date
1996
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gaubas, Eugenijus
;
Vanhellemont, Jan
;
Simoen, Eddy
;
Claeys, Cor
;
Clauws, P.
;
Kraner, H. W.
;
Vilkelis, G.
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1907
since deposited on 2021-09-29
2
last month
Acq. date: 2025-12-17
Citations