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Browsing by Author "Vissouvanadin, B."

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    Influence of the strain-relaxation induced defect creation on the leakage current of embedded Si1-xGex source/drain junctions

    Bargallo Gonzalez, Mireia
    ;
    Simoen, Eddy  
    ;
    Vissouvanadin, B.
    ;
    Verheyen, Peter  
    ;
    Loo, Roger  
    Oral presentation
    2008, International Conference on Extended Defects in Semiconductors - EDS

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