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Browsing by Author "Vlekken, J."

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    A thin foil optical strain gage based on silicon-on-insulator microresonators

    Taillaert, Dirk
    ;
    Van Paepegem, W.
    ;
    Vlekken, J.
    ;
    Baets, Roel  
    Proceedings paper
    2007-07, 3rd European Workshop on Optical Fibre Sensors - EWOFS, 4/07/2007, p.661914
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    Investigation of correlations between parameters defining the state of sputtered particles

    Vlekken, J.
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    Croes, Kris
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    D'Olieslaeger, Marc  
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    Knuyt, G.
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    Vandervorst, Wilfried  
    ;
    De Schepper, Luc
    Proceedings paper
    1998, SIMS XI - Secondary Ion Mass Spectrometry, 8/09/1997, p.931-934
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    Investigation of the correlation between parameters defining the state of sputtered particles

    Vlekken, J.
    ;
    Croes, Kris
    ;
    D'Olieslaeger, Marc  
    ;
    Knuyt, G.
    ;
    Vandervorst, Wilfried  
    Oral presentation
    1997, SIMS XI; 8-12 September 1997; Orlando, Fl., USA.
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    Investigation of the formation of M-2(+)-molecular ions in sputtering processes

    Vlekken, J.
    ;
    Croes, Kris
    ;
    Wu, Ting-Di
    ;
    D'Olieslaeger, Marc  
    ;
    Knuyt, G.
    ;
    Vandervorst, Wilfried  
    Journal article
    1999, Journal of the American Society for Mass Spectrometry, (10) 3, p.246-253
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    Investigation of the formation of sputtered oxide clusters with the laser assisted sputtered neutral mass spectrometry technique (LASNMS)

    Vlekken, J.
    ;
    Polus, D.
    ;
    D'Olieslaeger, Marc  
    ;
    Vandervorst, Wilfried  
    ;
    De Schepper, Luc
    Proceedings paper
    2000, Secondary Ion Mass Spectrometry - SIMS XII. Proceedings of the 12th International Conference, 5/09/1999, p.341-344
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    Investigation of the formation process of MCs+-molecular ions during sputtering

    Vlekken, J.
    ;
    D'Olieslaeger, Marc  
    ;
    Knuyt, G.
    ;
    Vandervorst, Wilfried  
    ;
    De Schepper, Luc
    Journal article
    2000, Journal of the American Society for Mass Spectrometry, (11) 7, p.650-658
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    Monte Carlo simulation of the formation of M2+ - molecular ions sputtered from metallic materials

    Vlekken, J.
    ;
    Wu, Ting-Di
    ;
    D'Olieslaeger, Marc  
    ;
    Knuyt, G.
    ;
    Vandervorst, Wilfried  
    ;
    De Schepper, Luc
    Proceedings paper
    1998, SIMS XI - Secondary Ion Mass Spectrometry, 8/09/1997, p.895-898
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    Monte Carlo simulation of the formation of M2-+ molecular ions sputtered from metallic materials

    Vlekken, J.
    ;
    Wu, Ting-Di
    ;
    D'Olieslaeger, Marc  
    ;
    Knuyt, G.
    ;
    Vandervorst, Wilfried  
    Oral presentation
    1997, SIMS XI; 8-12 September 1997; Orlando, Fl., USA.
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    Photonic skins for optical sensing: highlights of the PHOSFOS Project

    Berghmans, F.
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    Thienpont, H.
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    Van Daele, Peter  
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    Dubruel, P.
    ;
    urbanczyk, W.
    ;
    Rayss, J.
    ;
    Webb, D.J.
    Proceedings paper
    2009, Smart Structures and Materials, 5/10/2009, p.75030B
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    Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ions

    Vlekken, J.
    ;
    Wu, Ting-Di
    ;
    D'Olieslaeger, Marc  
    ;
    Knuyt, G.
    ;
    Vandervorst, Wilfried  
    ;
    De Schepper, Luc
    Journal article
    1998, Journal of the American Society for Mass Spectrometry, (9) 6, p.638-642

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