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Browsing by Author "Vogt, Ivo"

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    Detection of Failure Mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera

    Vogt, Ivo
    ;
    Nakamura, T.
    ;
    De Wolf, Ingrid  
    ;
    Boit, Christian
    Journal article
    2018, Microelectronics Reliability, 88-90, p.334-338

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