Browsing by Author "Waeytens, Ruben"
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Publication Analysis of the Influence of Roughness on the Propagation Constant of a Waveguide via Two Sparse Stochastic Methods
Proceedings paper2020, IEEE 29th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), OCT 05-07, 2020Publication Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness
Proceedings paper2023, 27th IEEE Workshop on Signal and Power Integrity (SPI), MAY 07-10, 2023