Publication:

Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness

Date

2023
Proceedings Paper
https://doi.org/10.1109/SPI57109.2023.10145572
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Published version 1.71 MB
Accepted version 878.87 KB

Author(s)

Huynen, Martijn  
;
Waeytens, Ruben
;
Bosman, Dries  
;
Gossye, Michiel  
;
Rogier, Hendrik  
;
Vande Ginste, Dries  

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N/A

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298 since deposited on 2023-07-27
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764 since deposited on 2023-07-27
Acq. date: 2026-06-25

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