Publication:

Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness

Date

2023
Proceedings Paper
https://doi.org/10.1109/SPI57109.2023.10145572
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dc.contributor.authorHuynen, Martijn
dc.contributor.authorWaeytens, Ruben
dc.contributor.authorBosman, Dries
dc.contributor.authorGossye, Michiel
dc.contributor.authorRogier, Hendrik
dc.contributor.authorVande Ginste, Dries
dc.contributor.imecauthorHuynen, Martijn
dc.contributor.imecauthorWaeytens, Ruben
dc.contributor.imecauthorBosman, Dries
dc.contributor.imecauthorGossye, Michiel
dc.contributor.imecauthorRogier, Hendrik
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecHuynen, Martijn::0000-0002-5168-9421
dc.contributor.orcidimecRogier, Hendrik::0000-0001-8139-2736
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.accessioned2024-06-04T09:24:41Z
dc.date.available2023-07-27T09:34:21Z
dc.date.available2024-06-04T09:24:41Z
dc.date.embargo2023-05-10
dc.date.issued2023
dc.identifier.doi10.1109/SPI57109.2023.10145572
dc.identifier.eisbn979-8-3503-3282-7
dc.identifier.issn2475-9481
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42200
dc.publisherIEEE
dc.source.conference27th IEEE Workshop on Signal and Power Integrity (SPI)
dc.source.conferencedateMAY 07-10, 2023
dc.source.conferencelocationAveiro
dc.source.journalN/A
dc.source.numberofpages4
dc.subject.keywordsUNCERTAINTY QUANTIFICATION
dc.title

Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness

dc.typeProceedings paper
dspace.entity.typePublication
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